dc.contributor.author |
Lojenaa, N. |
|
dc.contributor.author |
Scanlon, M. |
|
dc.contributor.author |
Le-Khac, N.A. |
|
dc.contributor.author |
De Zoysa, K. |
|
dc.contributor.author |
Sayakkara, A.P. |
|
dc.date.accessioned |
2025-05-08T06:54:12Z |
|
dc.date.available |
2025-05-08T06:54:12Z |
|
dc.date.issued |
2024-03-15 |
|
dc.identifier.citation |
Navanesan, L., Le-Khac, N.A., Scanlon, M., De Zoysa, K. and Sayakkara, A.P., 2024. Ensuring cross-device portability of electromagnetic side-channel analysis for digital forensics. Forensic Science International: Digital Investigation, 48, p.301684. |
en_US |
dc.identifier.uri |
http://drr.vau.ac.lk/handle/123456789/1162 |
|
dc.description.abstract |
Investigation on smart devices has become an essential subdomain in digital forensics. The inherent diversity and complexity of smart devices pose a challenge to the extraction of evidence without physically tampering with it, which is often a strict requirement in law enforcement and legal proceedings. Recently, this has led to the application of non- ntrusive Electromagnetic Side-Channel Analysis (EM-SCA) as an emerging approach to extract forensic insights from smart devices. EM-SCA for digital forensics is still in its infancy, and has only been tested on a small number of devices so far. Most importantly, the question still remains whether Machine Learning (ML) models in EM-SCA are portable across multiple devices to be useful in digital forensics, i.e., cross-device portability. This study experimentally explores this aspect of EM-SCA using a wide set of smart devices. The experiments using various iPhones and Nordic Semiconductor nRF52-DK devices indicate that the direct application of pre-trained ML models across multiple identical devices does not yield optimal outcomes (under 20 % accuracy in most cases). Subsequent experiments included collecting distinct samples of EM traces from all the devices to train new ML models with mixed device data; this also fell short of expectations (still below 20 % accuracy). This prompted the adoption of transfer learning techniques, which showed promise for cross-model implementations. In particular, for the iPhone 13 and nRF52-DK devices, applying transfer learning techniques resulted in achieving the highest accuracy, with accuracy scores of 98 % and 96 %, respectively. This result makes a significant advancement in the application of EM-SCA to digital forensics by enabling the use of pre-trained models across identical or similar devices. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Elsevier |
en_US |
dc.source.uri |
https://www.sciencedirect.com/science/article/pii/S2666281723002032 |
en_US |
dc.subject |
EM-SCA |
en_US |
dc.subject |
Cross-device portability |
en_US |
dc.subject |
Digital forensics |
en_US |
dc.subject |
Smart devices |
en_US |
dc.subject |
Deep-learning |
en_US |
dc.subject |
Side-channel analysis |
en_US |
dc.title |
Ensuring cross-device portability of electromagnetic side-channel analysis for digital forensics |
en_US |
dc.type |
Journal article |
en_US |
dc.identifier.doi |
https://doi.org/10.1016/j.fsidi.2023.301684 |
en_US |
dc.identifier.journal |
Forensic Science International: Digital Investigation |
en_US |